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analog automation analog verification Architecture ASIC Brian Bailey Cadence checkers C model Complex Architectures corner cases coverage coverage driven methodology coverage grid Coverage metrics coverage monitors DAC Dave Whipp Debugging Design design entry designers' guide consulting digital verification directed assembly code tests directed testing Distribution of Coverage Points Doug Smith Doulos DVClub DVCon emulation Eric Hennenhoefer ESL formal verification functional design verification functional verification general purpose microprocessor modeling OVM RTL testbench SystemVerilog Technical Review UVM Validation Verification verification jobs
Tag Archives: coverage grid
Posted on March 27, 2009 by admin
This article presents an overview of functional design verification using a coverage driven methodology while attempting to answer the question of how much testing is enough. Continue reading →
Posted in Technical Review
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Tagged checkers, Complex Architectures, corner cases, coverage driven methodology, coverage grid, Coverage metrics, coverage monitors, directed assembly code tests, directed testing, Distribution of Coverage Points, functional design verification, general purpose microprocessor, mobile computing, random test generator, RTL testbench, Verification Progress
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