Tags
analog automation analog verification Architecture ASIC Brian Bailey Cadence checkers C model Complex Architectures corner cases coverage coverage driven methodology coverage grid Coverage metrics coverage monitors DAC Dave Whipp Debugging Design design entry designers' guide consulting digital verification directed assembly code tests directed testing Distribution of Coverage Points Doug Smith Doulos DVClub DVCon emulation Eric Hennenhoefer ESL formal verification functional design verification functional verification general purpose microprocessor modeling OVM RTL testbench SystemVerilog Technical Review UVM Validation Verification verification jobs
Tag Archives: Brian Bailey
Posted on March 5, 2010 by admin
By Doug Smith of Doulos Conferences aren’t my favorite events to attend. They tend to be dominated by the big three EDA companies, and the messages are usually just a variation on what was said last year. However, there is … Continue reading →
Posted in DV Conferences, Technical Review
|
Tagged Brian Bailey, Cadence, Design, Doug Smith, Doulos, DVCon, Mentor, modeling, OVM, Synopsys, SystemC, SystemVerilog, UVM, VMM
|
1 Comment
Posted on August 5, 2009 by admin
Written by Brian Bailey for DVClub At DAC this year, one of the main themes was ESL but not in the usual sense of it having a lot of promise but little to deliver. This year it had a lot … Continue reading →
Posted in DV Conferences
|
Tagged Brian Bailey, coverage, DAC, Debugging, Design, ESL, modeling, Technical Review, Verification, virtual platforms
|
1 Comment
Posted on March 23, 2009 by admin
By Grant Martin This blog post originally appeared at: http://www.chipdesignmag.com/martins/2009/03/19/bailey-on-verification-at-the-club/ — March 19, 2009 @ 11:14 pm Today I attended the latest meeting of the Silicon Valley branch of the DVClub. For those not familiar with the DVClub (DV = … Continue reading →
Posted in Silicon Valley, Technical Review
|
Tagged Brian Bailey, DVClub, Eric Hennenhoefer, Is it time to declare a verification war?, Silicon Valley, Technical Review
|
Comments Off
